Santec's scanning test systems are designed to simplify photonics testing and provide a complete solution where high speed analysis, high resolution and high accuracy are key, Santec's tunable lasers (TSL-770, TSL-570, etc.) coupled with an optical power meter (MPM-210H), a polarization controller (PCU-110), and a customized version of the software make up a complete scanning The test system is optimized for WDL and PDL measurements and is suitable for both R&D and production environments. The system uses a real-time reference to simultaneously acquire the output power of the tunable laser and the optical power transmitted through the DUT, providing more accurate WDL and PDL analysis using the Mueller matrix method. Test data throughput is maximized by resampling and tuning algorithms while maintaining measurement integrity.Santec's MPM-210H power meter mainframe can also be used in conjunction with the 4-channel galvanometer module MPM-213. The combination of the scanning test system and the MPM-210H/MPM-213 is suitable for testing the performance of fiber optic components such as transceiver photodiodes (ROSA/Coherent receiver, etc.) or optical channel monitoring.
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