RF

RF Microwave

Megatron offers proven RF and microwave solutions with extremely accurate models and powerful test techniques covering circuit, electromagnetic (EM) and system level design.

RF and microwave design challenges

The increasing number of substrate layers, smaller form factors, complex packaging technologies, and better design proximity are making design more challenging.

Seamless IC and EMF simulation tools can cover the entire process from schematic input to production and verification.

Continuous innovation in simulation technology performance can dramatically reduce simulation speed while increasing accuracy.

Active Devices

Power amplifiers are an important part of any RF design. These important components ensure that the RF signal reaches the proper transmission power level and strength needed by the receiver to identify and decode the signal. From low-noise amplifiers commonly used in receiver front ends to high-power amplifiers used in large broadcast TV systems, a variety of applications face serious challenges such as signal distortion, power consumption, and various measurement and re-run issues.

Our solutions offer high RF measurement performance, dynamic low-power analysis and best-in-class test speed for design verification.

Passive Devices

Passive devices include a variety of basic devices used in RF and digital designs. Such devices include RF filters, combiners, antennas, couplers, cables, connectors, and printed circuit boards. Megatron's network analyzers provide S-parameter measurements and time-domain reflectometer capabilities to find anomalies in the signal path. Multi-port solutions facilitate rapid multi-site production testing at low cost.

MIMO and Active Beamforming System Design and Test

Antennas are gaining importance in system-level design due to MIMO and active beamforming. Beamforming is a standard feature in radar applications. With the implementation of 5G and microwave frequencies in mobile communications, beamforming will also become an important feature in this area. The problem of free field attenuation at higher frequencies must be addressed, especially at millimeter wave frequencies. We offer a wide range of shielded darkroom and shielded box solutions, covering almost all sizes and supporting both far-field and near-field testing, including software solutions for near-field to far-field conversion.