Tunable Laser System Source

• Wavelength range: 800-1700 nm, covering full O/E/S/C/L/U bands
• Power measurement range: -80 dBm to +23 dBm with auto-ranging capability
• Power measurement accuracy: ±0.02 dB (typical), calibrated (at 23°C±5°C)
• Resolution: 0.001 dB (high precision mode)
• Detector type: InGaAs (low-noise design)
• Connector interface: FC/PC (standard), optional FC/APC or SC interfaces
• Calibration wavelengths: 850/980/1310/1490/1550/1625 nm (NIST-traceable)
• Communication interfaces: GPIB/USB/LAN with SCPI remote control support
• Typical applications: Optical module production testing, fiber link loss measurement, passive device insertion loss analysis

Tunable Laser System Source

• Wavelength range: 1480-1640 nm (C+L band coverage)
• Output power: Up to +13 dBm
• Power stability: < ±0.01 dB (over 8 hours)
• Spectral linewidth: < 100 kHz (typical)
• Wavelength accuracy: ±1 pm (calibrated)
• Tuning step size: Minimum 1 pm

Tunable Laser System Source

• Covers 1480-1640 nm (C+L band), resolution 0.1 pm
• Supports ITU-T DWDM standard channels (50 GHz/100 GHz spacing)
• Expandable to 1260-1650 nm (optional O/E/S band module)
•Compatible with Keysight 816x series mainframe
•Communication interfaces:
•Standard: GPIB/USB
•Optional: LAN (LXI-C class)
•Supports SCPI/Python/LabVIEW control

Tunable Laser System Source

• ​​Wavelength Range:​​ 700~1700nm (covers O/E/S/C/L bands)
• ​Dynamic Range:​​ +3dBm to -90dBm with 0.001dB resolution
• ​​Calibration Accuracy:​​ ±0.02dB (supports user-defined calibration)
• ​​Sampling Rate:​​ 10μs high-speed sampling for transient power fluctuation capture
• ​​Data Analysis:​​ Built-in trend chart/histogram with BER estimation capability
• ​​Automation:​​ Compatible with Keysight mainframe architecture, SCPI command control supported
• ​​Long-term Stability:​​ <0.01dB power fluctuation (ideal for aging tests)
• ​​Noise Performance:​​ Low-noise design ensures accurate weak signal measurement

Tunable Laser System Source

• Application areas: optical communication testing, DWDM, coherent communication, fiber optic sensing, device characterization
• Wavelength range: 1480~1640nm (expandable), ±0.2pm high accuracy
• Spectral characteristics: ultra-narrow linewidth (<100kHz), low RIN noise (<-155dB/Hz)
• Output modes: supports CW continuous wave and modulated laser outputs
• Stability: power fluctuation <0.01dB, suitable for long-term testing
• System Integration: compatible with Agilent host architecture, support for automation control
• Typical use: optical device testing, system verification, laboratory research and development

Tunable Laser System Source

- 200nm/s fast scanning
- Line width < 60kHz
- < 1/10 frequency fluctuation (vs. conventional models)

Tunable Laser System Source

• Highest measurement range through low spontaneous source emission (low SSE), Signal to SSE Ratio >70 dB/nm
• Variable sweep speed up to 80 nm/s
• Wide tuning range units to cover all transmission bands: 1260 nm – 1640 nm
• Built-in wavelength meter with excellent wavelength accuracy ±3.6 pm
• High optical output power up to +9 dBm with built-in high performance 60 dB attenuator

Tunable Laser System Source

- Full range of non-mode hopping design, can achieve non-mode hopping fast wavelength scanning in the 1500nm ~ 1600nm band, scanning speed up to 200nm/s.
- High wavelength accuracy design, can achieve 0.1pm wavelength setting resolution and ±20pm wavelength absolute accuracy.

Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Tuning time: 300 ms for a 1 nm step
• Max. power: > +12 dBm peak typ. (Options 114, 116, 216) or > +13 dBm peak typ. (Option 113)
• Signal to SSE ratio: ≥ 75 dB/nm typical
• Absolute wavelength accuracy: ±10 pm typical