Other

• Provides better than -35 dB EVM for high-performance measurements
• Ideal for WiGig chipset and baseband module characterization at R&D and DVT

Low noise amplifiers

• Calibrated RF ports enable direct connection for simple text fixture setups
• Lab grade performance in compact 2U form factor
• Support for wider frequency range with over 1.7GHz of instantaneous bandwidth

Other

• Frequency range: 9kHz~6.3GHz/9GHz/20GHz
• Frequency Accuracy: ±(0.05ppm+5Hz)
• Reference Level: -130dBm~+30dBm
• Sweep Width: 100Hz~Full Sweep Width, 0Hz
• Resolution bandwidth: 1Hz~3MHz/10MHz

Source Measurement Unit (SMU)

• 0.0035% Basic DC Voltage Accuracy
• 0.06% Basic AC Voltage Accuracy
• 10mA to 3A Current Range
• 3 Hz to 300 kHz AC bandwidth
• Storage memory up to 512 readings

Source Measurement Unit (SMU)

• Variable integration time: 10 μs to 10 s (7461A/7461P) 100 μs to 10 s (7451A)
• High-resolution DCI measurements: 1 nA (7461A), 10 nA (7451A)
• Dual-channel DC voltage measurement

Source Measurement Unit (SMU)

• Perform parallel tests for unrivalled throughput
• 20,000 readings/second provides faster test times and the ability to capture device transient performance
• Series offers wide dynamic range: 1fA to 10A and 1µV to 200V
• TSP-Link bus supports channel expansion of up to 32 units/64 channels per GPIB or IP address

Source Measurement Unit (SMU)

• 16 ppm basic DCV accuracy allows you to measure with confidence.
• 1 µA range and pA resolution allows testing of low power devices.
• Flexible automated measurements are available via USB or LAN/LXI core interface.
• Now includes digitizing and advanced triggering (DIG) capabilities.

Other

• All-in-one compact 40 G/100 GbE Ethernet analyzer
• I/F upgrades based on budget and schedule
• Superior operability, rugged, compact, lightweight construction, low-noise design

Other

• Repeatability: ±0.01 dB, ±0.004 dB typical
• Switching time: < 20 ms
• Operating life: > 1 billion cycles