Tunable Laser System Source

• Covers 1480-1640 nm (C+L band), resolution 0.1 pm
• Supports ITU-T DWDM standard channels (50 GHz/100 GHz spacing)
• Expandable to 1260-1650 nm (optional O/E/S band module)
•Compatible with Keysight 816x series mainframe
•Communication interfaces:
•Standard: GPIB/USB
•Optional: LAN (LXI-C class)
•Supports SCPI/Python/LabVIEW control

Tunable Laser System Source

• ​​Wavelength Range:​​ 700~1700nm (covers O/E/S/C/L bands)
• ​Dynamic Range:​​ +3dBm to -90dBm with 0.001dB resolution
• ​​Calibration Accuracy:​​ ±0.02dB (supports user-defined calibration)
• ​​Sampling Rate:​​ 10μs high-speed sampling for transient power fluctuation capture
• ​​Data Analysis:​​ Built-in trend chart/histogram with BER estimation capability
• ​​Automation:​​ Compatible with Keysight mainframe architecture, SCPI command control supported
• ​​Long-term Stability:​​ <0.01dB power fluctuation (ideal for aging tests)
• ​​Noise Performance:​​ Low-noise design ensures accurate weak signal measurement

Tunable Laser System Source

• Application areas: optical communication testing, DWDM, coherent communication, fiber optic sensing, device characterization
• Wavelength range: 1480~1640nm (expandable), ±0.2pm high accuracy
• Spectral characteristics: ultra-narrow linewidth (<100kHz), low RIN noise (<-155dB/Hz)
• Output modes: supports CW continuous wave and modulated laser outputs
• Stability: power fluctuation <0.01dB, suitable for long-term testing
• System Integration: compatible with Agilent host architecture, support for automation control
• Typical use: optical device testing, system verification, laboratory research and development

Tunable Laser System Source

- 200nm/s fast scanning
- Line width < 60kHz
- < 1/10 frequency fluctuation (vs. conventional models)

Tunable Laser System Source

• Highest measurement range through low spontaneous source emission (low SSE), Signal to SSE Ratio >70 dB/nm
• Variable sweep speed up to 80 nm/s
• Wide tuning range units to cover all transmission bands: 1260 nm – 1640 nm
• Built-in wavelength meter with excellent wavelength accuracy ±3.6 pm
• High optical output power up to +9 dBm with built-in high performance 60 dB attenuator

Tunable Laser System Source

- Full range of non-mode hopping design, can achieve non-mode hopping fast wavelength scanning in the 1500nm ~ 1600nm band, scanning speed up to 200nm/s.
- High wavelength accuracy design, can achieve 0.1pm wavelength setting resolution and ±20pm wavelength absolute accuracy.

Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Tuning time: 300 ms for a 1 nm step
• Max. power: > +12 dBm peak typ. (Options 114, 116, 216) or > +13 dBm peak typ. (Option 113)
• Signal to SSE ratio: ≥ 75 dB/nm typical
• Absolute wavelength accuracy: ±10 pm typical

Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Sweep speeds: up to 200 nm/s, bidirectional
• Max. power: > +12 dBm peak (Options 114, 116, 216) or > +13 dBm peak (Option 113)

Tunable Laser System Source

• OSICS T100: Ultra-Low SSE Tunable External Cavity Laser (Step Mode)
• OSICS DFB: Distributed Feedback Semiconductor Laser Tube for DWDM, CWDM and LAN-WDM Transmission