Optical communication test equipment | Mega - Test and Measurement Technology Services, Inc.

AQ6150B Yokogawa

Wavelength meter

• DFB Laser Calibration for Optical Amplification Measurement Systems
• Tunable Laser Calibration for Passive Component Measurement Systems
• Highly Accurate Tunable Laser Adjustment and Detection
• Measurement of optical transceiver and transponder modulation signals
• Measurement of all channels of 40G and 100G optical transceivers via WDM technology

RTO6 R&S

Oscilloscope

• Maximum 6 GHz bandwidth
• One million waveforms per second
• 9.4 ENOB for exceptional signal integrity
• Maximum 2 Gpoints memory depth
• Unique frequency-area triggering

MXO 5 R&S

Oscilloscope

• Industry-leading system architecture: 18-bit vertical resolution/12-bit ADCs
• Industry-leading standard storage: 500 Mpts

MXO 4 R&S®

Oscilloscope

• Bandwidth: 350 MHz to 2 GHz (four channels); 100 MHz to 2 GHz (eight channels)
• World's first oscilloscope to capture more than 4.5 million waveforms per second

Yenista OSICS

Tunable Laser System Source

• OSICS T100: Ultra-Low SSE Tunable External Cavity Laser (Step Mode)
• OSICS DFB: Distributed Feedback Semiconductor Laser Tube for DWDM, CWDM and LAN-WDM Transmission

TSL-550 Santec

Tunable Laser System Source

• Wavelength range 1260 to 1680nm selectable (*)
• High output power + 13dBm
• High SNR: 90dB/0.1nm

TSL-570 Santec

Tunable Laser System Source

• 200nm/s high speed scanning
• High accuracy (±2pm) & high resolution (0.1pm)
• High signal-to-noise ratio: 90dB/0.1nm
• Multiple wavelength options from 1240-1680nm

MP2110A Anritsu

Oscilloscope

• NRZ jitter component analysis
• Low jitter PPG: 600 fs (typical)
• High sensitivity ED: 25 mV (typical)

83484A keysight

Oscilloscope

• Dual electrical measurement channels
• 50 GHz and 26.5 GHz selectable bandwidth
• 2.5/12.5 GHz trigger port (set by host)