Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Scanning speed: up to 200 nm/s, bidirectional
• Maximum power: > +12 dBm peak typical (options 114, 116, 216) or > +13 dBm peak typical (option 113)

Power Meter

• Sensor type: InGaAs
• Wavelength range: 800-1700 nm
• Power range: +3 to -90 dBm
• Accuracy: ±2.5% (1000-1650 nm)

Oscilloscope

• Bandwidth: 70 MHz to 300 MHz
• Sample rate: 2.5 Gsample/s maximum
• Memory depth: 20 Msample maximum

Power Meter

• 1 µs minimum averaging time
• 8 sensor ports
• Scanning and recording application software (no ranging) with up to 65 dB dynamic range
• Power uncertainty ±2.5 %

Power Meter

• Power range: + 10 dBm to - 110 dBm
• Wavelength range: 800 - 1700 nm

Attenuation

• Excellent repeatability with insertion loss of 0.03 dB after 5 million repetitions, ensuring accurate measurements and reducing calibration frequency
• Excellent attenuation accuracy and flatness ensure accurate measurements

Attenuation

• Excellent attenuation accuracy and flatness ensure accurate measurements
• Multi-channel attenuation path of up to 4 channels allows you to measure multiple devices under test at once

Tunable Laser System Source

• Seamless wavelength coverage: the new option 3xx bridges the wavelength gap between C- and L-band channels
• Compact instrument form factor, half the width of 19.5 inches and only 1U high

Tunable Laser System Source

• Compact instrument with four ports, half the width of 19 inches and only 1U high
• Flexible configuration between C-band and L-band channels