E4809A Agilent 13.5 GHz Central Clock ParBERT Module

• Parallel Bit Error Ratio Tester

• 81200: Configurable for 675 Mb/s to 2.7 Gb/s Analysis

• 81250: Configurable for 675 Mb/s to 45 Gb/s Analysis

• Modular BER Test Platform

• Generate and Analyze PRWS, PRBS, and User-Defined Patterns

If you are an engineer in R&D or manufacturing performing functional and parametric testing of digital subsystems, ICs or circuit boards, the Agilent 81200 data generator/analyzer platform is the right choice for you. 81200 allows thorough verification and qualification of digital devices throughout the development cycle, reducing risk, cost and time to market.

The 81200 is a modular system offering excitation and analysis channels in speed classes 200/330/675/2.700Mb/s.

The Agilent ParBERT 81250 is a modular, parallel electrical and optical bit-error-rate (BER) test platform that operates at speeds up to 45 Gb/s. The ParBERT 81250 platform includes modules operating at 675 Mb/s, 1.65 Gb/s, 2.7 Gb/s, 3.35 Gb/s, 7 Gb/s, 10.8 Gb/s, 13.5 Gb/s and 45 Gb/s . The system generates pseudo-random word sequences (PRWS), standard pseudo-random binary sequences (PRBS), and user-defined patterns on parallel lines. You can analyze the BER with user-defined patterns, PRBS/PRWS or mixed data (a combination of user-defined patterns and PRBS).

The ParBERT 81250 is perfectly suited for parallel-to-serial, serial-to-parallel, serial-to-serial, and multiple serial BER testing. For example, multiplexer and demultiplexer (Mux/Demux) - or SerDes (serializer/descrambler) - testing is used for telecom and storage area network (SAN) ICs, multiple transmitter and receiver testing for manufacturing, amplifiers, and 10GbE and forward error correction (FEC) device testing.

It is also an ideal extension of the IC tester's high-speed channel.

If required, the ParBERT 81250 also provides data and control signals for the DUT.