MP2100B Anritsu BER oculograph oscilloscope

The BERTWave MP2100B is an all-in-one tester with built-in BERT and sampling oscilloscope to support optical module evaluation including BER measurement, eye diagram template testing and eye diagram analysis.

The BERT and sampling oscilloscope are necessary testers for evaluating optical modules used in optical communication systems. Previously, when evaluating modules such as QSFP+ and SFP+, separate BERT and sampling oscilloscopes needed to be configured. Now with the BERTWave MP2100B, its all-in-one design integrates up to 4 channels of BERT and sampling oscilloscopes in a single compact 18-cm deep cabinet, significantly cutting equipment investment costs and saving operating space.

In addition, when using the BERTWave MP2100B, BER measurements, eye diagram template tests and eye diagram analysis can be performed simultaneously without changing connection lines, thus reducing measurement time. Moreover, BER measurement channels can be expanded to four, and 4-channel BER measurement, eye diagram template test and eye diagram analysis can be performed simultaneously. Finally, the built-in SFP+ module slot eliminates the need for an external light source.

The BERTWave MP2100B's BERT measures bit-error-rate (BER) at bit rates between 125 Mbit/s and 12.5 Gbit/s, and its built-in BERT option for up to four channels makes it easy to configure multi-channel optical module test systems such as QSFP+ and AOC. The differential signal supports not only bit-error-rate (BER) measurements, but also eye diagram template testing and eye diagram analysis.

The BERTWave MP2100B sampling oscilloscope has an electrical interface with a bandwidth of 25 GHz (typical) and an optical interface with a bandwidth of 9 GHz (typical). In addition, with this oscilloscope, up to six optical Bessel filters can be built in for measuring optical signals. Using these filters, one MP2100B enables extinction ratio measurements, eye diagram template testing and eye diagram analysis for a variety of different applications. In addition, the oscilloscope features a fast sampling mode as standard to ensure high-speed measurements; in fast sampling mode, sampling speeds of up to 150k samples/second are 1.5 times faster than older models and enable fast eye-diagram template testing and eye-diagram analysis.

With the MX210001A jitter analysis software, one unit enables simultaneous jitter analysis, eye diagram and eye diagram template measurements. 150k samples/second sampling speed also makes more efficient use of measurement time. Used in conjunction with MATLAB®, it can be used to support waveform dispersion measurements for specific signals such as WDP, TWDP, and dWDP.

Finally, the MX210002A transmission analysis software adds device transmission (S21 gain, phase) analysis, as well as inverse embedded waveform simulation performed using equalizers, filters, and weighting calculations. Simultaneous waveform sampling and simulation, as well as simultaneous eye diagram measurements and eye diagram template measurements, are also supported. Simulated waveform synchronous jitter measurements can also be performed in conjunction with the MX210001A software.

Anritsu BERTWave™ (10G BERT, sampling oscilloscope) MP2100B (Figure 1)

• For 10 / 40G multi-channel block/device development and manufacturing

• All-in-one built-in 4-channel BERT and sampling oscilloscope

• Bit Error Rate (BER) 4-channel simultaneous measurement

• High quality waveform PPG (1 ps rms jitter)

• High input sensitivity (10 mVp-p minimum input sensitivity)

• High-speed eye diagram template test up to 150 k samples/sec with eye diagram analysis

• Supports differential signal BER measurements, eye diagram template testing and eye diagram analysis

• Choice of up to six Bessel filters for full-featured application support

• Compact (18 cm deep) optical module evaluation tester

• Simultaneous bit-error-rate (BER), eye diagram, eye diagram template and jitter measurements in one unit

• Supports WDP (waveform dispersion loss) measurements

• Supports optimal sampling calculations for testing eye diagrams in both weighted and balanced conditions

• Simulates simultaneous eye diagram patterns, eye diagram templates and jitter measurements of waveforms