MS46524B Anritsu High Performance Vector Network Analyzer
Key Features
Advanced time domain options provide tools for signal integrity (SI) analysis
Industry-leading dynamic range allows measurement of ultra-low reflection artifacts
Excellent orientation correction capability minimizes measurement uncertainty
SmartCal auto-calibration unit reduces calibration and setup time
Time domain with time domain gate option for TDR measurements
Latest LAN interface for remote control is faster than GPIB
Compact 3U chassis package easily utilizes rack space
Source and receiver access loop and bias section options allow for maximum customization of test setup
Description
The MS46524B is a 4-port high performance ShockLine vector network analyzer. Offering best-in-class dynamic range, it reduces test costs and speeds time to market in a wide range of test applications up to 43.5 GHz. The MS46524B is available with option 10, option 20, or option 43, and these frequency options, combined with the powerful ShockLine software, provide a challenging and cost effective solution for passive device testing. For applications requiring time domain analysis, Option 2 enables the MS46524B to provide real-time bandpass and low-pass time domain capabilities. The low-pass time domain features a test data report that shows the actual impedance over distance or time. Option 22 gives the MS46524B a file-based signal integrity (SI) tool to debug SI problems and verify circuit models. additional options can be added to the MS46524B-010 VNA. Options 51 and 61, the source and receiver access loop and bias section options, respectively, give maximum flexibility for customizing test setups. The source and receiver access loops improve the background noise of the instrument and reduce the receiver compression point, allowing DUT testing with high dynamic range requirements. The bias section provides a DC power interface for testing devices that require DC bias during testing.
Application Areas
Differential devices, coaxial RF connectors, antennas, switches, duplexers, UE front-end modules, RF (FAKRA) connectors, driver assistance radar, passive component testing, system calibration, differential path loss characterization, general S-parameter and time-domain measurements, simple active device test procedures: amplifier characterization, optoelectronic & electro-optical applications
Key performance and specifications.
Key Features
Advanced time domain options provide tools for signal integrity (SI) analysis
Industry-leading dynamic range allows measurement of ultra-low reflection artifacts
Excellent orientation correction capability minimizes measurement uncertainty
SmartCal auto-calibration unit reduces calibration and setup time
Time domain with time domain gate option for TDR measurements
Latest LAN interface for remote control is faster than GPIB
Compact 3U chassis package easily utilizes rack space
Source and receiver access loop and bias section options allow for maximum customization of test setup
Description
The MS46524B is a 4-port high performance ShockLine vector network analyzer. Offering best-in-class dynamic range, it reduces test costs and speeds time to market in a wide range of test applications up to 43.5 GHz. The MS46524B is available with option 10, option 20, or option 43, and these frequency options, combined with the powerful ShockLine software, provide a challenging and cost effective solution for passive device testing. For applications requiring time domain analysis, Option 2 enables the MS46524B to provide real-time bandpass and low-pass time domain capabilities. The low-pass time domain features a test data report that shows the actual impedance over distance or time. Option 22 gives the MS46524B a file-based signal integrity (SI) tool to debug SI problems and verify circuit models. additional options can be added to the MS46524B-010 VNA. Options 51 and 61, the source and receiver access loop and bias section options, respectively, give maximum flexibility for customizing test setups. The source and receiver access loops improve the background noise of the instrument and reduce the receiver compression point, allowing DUT testing with high dynamic range requirements. The bias section provides a DC power interface for testing devices that require DC bias during testing.
Application Areas
Differential devices, coaxial RF connectors, antennas, switches, duplexers, UE front-end modules, RF (FAKRA) connectors, driver assistance radar, passive component testing, system calibration, differential path loss characterization, general S-parameter and time-domain measurements, simple active device test procedures: amplifier characterization, optoelectronic & electro-optical applications
Key performance and specifications.