N7776C keysight Tunable Laser Source Description
The Keysight N7776C Select Series of Tunable Laser Sources delivers outstanding accuracy and sub-picometer repeatability in static and scanning work, dramatically improving test efficiency.
Model No.: N7776C
Name: Tunable Laser Source
Brand：keysight
Category：General Electronic Test >Tunable Laser Source
Product Attributes：Mainfram
Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
Scanning speed: up to 200 nm/s, bi-directional
Maximum power: > +12 dBm peak (options 114, 116, 216) or > +13 dBm peak (option 113)
Signal to SSE ratio: ≥ 80 dB/nm typical
Absolute wavelength accuracy: ±1.5 pm typical (also achievable in continuous scan)
Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
Scanning speed: up to 200 nm/s, bi-directional
Maximum power: > +12 dBm peak (options 114, 116, 216) or > +13 dBm peak (option 113)
Signal to SSE ratio: ≥ 80 dB/nm typical
Absolute wavelength accuracy: ±1.5 pm typical (also achievable in continuous scan)
The new Keysight N7776C Select Series tunable laser source delivers outstanding accuracy in both static and scanning work, dramatically improving test efficiency. Featuring bi-directional scanning speeds up to 200 nm/s and sub-picometer repeatability without compromising specified dynamic accuracy, it accelerates the wavelength-dependent alignment process and auto-calibration of wavelength-selective devices. Shorter test times and faster scanning wavelength testing help reduce cost per device, increase test margins and reduce cost of ownership.
The N7776C is capable of delivering more than +12 dBm of output power at the lowest spontaneous emission levels in the product family, allowing for the verification of ultra-deep filters. Equipped with a high-resolution wavelength reference unit for real-time tracking and control, the N7776C delivers ultra-high wavelength accuracy, and includes a gas chamber for long-term stability and self-tuning.
Like its predecessors, the 81600B and 81606A, the new N7776C tunable laser source can be used with a suite of optical communications applications to perform spectral measurements such as insertion loss, polarisation dependent loss and dispersion. It can also be used with the N774xC multiport power meter and the N7786C polarisation synthesiser to provide improved wavelength scanning accuracy and excellent dynamic ranging for measurements of filter stopbands and passbands.
All N777xC tunable laser sources incorporate a common cavity and laser source module design, offering the advantages of narrow linewidth, high long-term stability and low levels of spontaneous emission. Their software is compatible with the 8160xA and 81600B laser sources that have been the industry's most popular for more than a decade, while taking up less rack space (1U less). The remote user interface on this instrument can be accessed using a web browser over a LAN or USB connection. Local operators can view current operating parameters via the optional touchscreen.
The Keysight N7776C Select Series of Tunable Laser Sources delivers outstanding accuracy and sub-picometer repeatability in static and scanning work, dramatically improving test efficiency.
Model No.: N7776C
Name: Tunable Laser Source
Brand：keysight
Category：General Electronic Test >Tunable Laser Source
Product Attributes：Mainfram
Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
Scanning speed: up to 200 nm/s, bi-directional
Maximum power: > +12 dBm peak (options 114, 116, 216) or > +13 dBm peak (option 113)
Signal to SSE ratio: ≥ 80 dB/nm typical
Absolute wavelength accuracy: ±1.5 pm typical (also achievable in continuous scan)
Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
Scanning speed: up to 200 nm/s, bi-directional
Maximum power: > +12 dBm peak (options 114, 116, 216) or > +13 dBm peak (option 113)
Signal to SSE ratio: ≥ 80 dB/nm typical
Absolute wavelength accuracy: ±1.5 pm typical (also achievable in continuous scan)
The new Keysight N7776C Select Series tunable laser source delivers outstanding accuracy in both static and scanning work, dramatically improving test efficiency. Featuring bi-directional scanning speeds up to 200 nm/s and sub-picometer repeatability without compromising specified dynamic accuracy, it accelerates the wavelength-dependent alignment process and auto-calibration of wavelength-selective devices. Shorter test times and faster scanning wavelength testing help reduce cost per device, increase test margins and reduce cost of ownership.
The N7776C is capable of delivering more than +12 dBm of output power at the lowest spontaneous emission levels in the product family, allowing for the verification of ultra-deep filters. Equipped with a high-resolution wavelength reference unit for real-time tracking and control, the N7776C delivers ultra-high wavelength accuracy, and includes a gas chamber for long-term stability and self-tuning.
Like its predecessors, the 81600B and 81606A, the new N7776C tunable laser source can be used with a suite of optical communications applications to perform spectral measurements such as insertion loss, polarisation dependent loss and dispersion. It can also be used with the N774xC multiport power meter and the N7786C polarisation synthesiser to provide improved wavelength scanning accuracy and excellent dynamic ranging for measurements of filter stopbands and passbands.
All N777xC tunable laser sources incorporate a common cavity and laser source module design, offering the advantages of narrow linewidth, high long-term stability and low levels of spontaneous emission. Their software is compatible with the 8160xA and 81600B laser sources that have been the industry's most popular for more than a decade, while taking up less rack space (1U less). The remote user interface on this instrument can be accessed using a web browser over a LAN or USB connection. Local operators can view current operating parameters via the optional touchscreen.