Tektronix Leads Industry by Showcasing Innovative Optoelectronic Test Solutions at Opto Expo
The 24th China International Optoelectronic Expo (CIOE 2023) opened at the Shenzhen Convention and Exhibition Centre. This is the world's largest photovoltaic industry event, attracting thousands of companies and professionals from around the world to exhibit and visit. In this exposition, there is a company's booth is particularly eye-catching, it is the world's leading test and measurement instrument manufacturer - Tektronix (Tektronix).
Tektronix's products cover a wide range of fields such as oscilloscopes, logic analysers, spectrum analysers, signal sources, power supplies, multi-meters, sensors, etc., which are widely used in communication, computer, aerospace, automotive, medical, education and other industries. Tektronix has won the trust and praise of customers around the world with its innovative technology, excellent performance and superior quality. At the Optical Expo, Tektronix demonstrated a variety of innovative optoelectronic test solutions covering the latest technology needs in the fields of optical communications, data centres and sensors.
Tektronix demonstrated its real-world test solution for 400G/800G PAM4, a high-speed serial communication technology that can transmit more data with the same bandwidth, and is one of the key technologies to achieve the 400G/800G Ethernet standard. However, PAM4 signals also bring higher testing difficulty, and it is a challenge to effectively measure the quality and performance of PAM4 signals. Tektronix provides a complete set of solutions for this, including a new generation of optical sampling oscilloscopes such as TSO820 and high-performance real-time oscilloscopes such as DPO70000SX. These products can provide up to 70GHz bandwidth and 256GS/s sampling rate, support PAM4 eye diagram, BER, linear regression and many other analysis functions, and can be seamlessly integrated with third-party software for automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers optimise designs, reduce costs and shorten time-to-market.
Grammertech's demonstration of test solutions for 802.3ck optical transmitters. 802.3ck is a new Ethernet standard that supports 100Gbps/200Gbps/400Gbps single-channel rates and uses more complex modulation formats and coding methods. This means more stringent test requirements and specifications for optical transmitters. Tektronix provides a set of solutions for this based on products such as the DPO70000SX real-time oscilloscope and AWG70000 arbitrary waveform generator. This set of solutions can provide up to 70GHz bandwidth and 256GS/s sampling rate, support for a variety of test items under the 802.3ck standard, such as output optical power, eye diagram, eye diagram mask, hopping time, signal integrity, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers meet the requirements of the 802.3ck standard and enhance product competitiveness.
Tektronix's demonstration of the G.Metro test solution. G.Metro is a new optical transmission network architecture based on wavelength division multiplexing (WDM) technology, which enables the transmission of signals of multiple wavelengths on the same optical fibre, thus increasing the utilisation of the optical fibre and the capacity of the network. However, G.Metro also brings higher testing difficulty, and it is a challenge to effectively measure various parameters and performance in G.Metro networks. Tektronix provides a set of solutions for this purpose based on products such as the OM5110 Multi-Wavelength Signal Generator and the DPO70000SX Real-Time Oscilloscope. This set of solutions can provide up to 70GHz bandwidth and 256GS/s sampling rate, support a variety of test items under the G.Metro standard, such as wavelength stability, frequency deviation, phase noise, dispersion, signal-to-noise ratio, etc., and can be seamlessly integrated with third-party software for automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers optimise network design, reduce O&M costs and improve network performance.
Tektronix for 3D sensor testing and optoelectronic device LIV characteristics analysis of the demonstration. 3D sensor is a use of optical principles to measure the shape of the surface of the object and the depth of the information of the device, which has a wide range of applications in smart phones, automotive, medical, security and other fields. An optoelectronic device is a device that converts electrical signals into optical signals or optical signals into electrical signals, and it is one of the core components that make up a 3D sensor. For 3D sensors and optoelectronic devices, a wide range of parameters and performances need to be tested and analysed to ensure their functionality and quality. Tektronix provides a set of solutions for this purpose based on products such as the DPO70000SX real-time oscilloscopes and Keithley 2600B series source testers. This solution can provide up to 70GHz bandwidth and 256GS/s sampling rate, support for 3D sensor testing under a variety of test items, such as laser pulse width, laser pulse peak power, laser pulse repetition frequency, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. The solution can also support a variety of test items under LIV characterisation of optoelectronic devices, such as current-voltage (I-V) curves, current-light power (I-L) curves, current-wavelength (I-λ) curves, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers evaluate product performance.
The 24th China International Optoelectronic Expo (CIOE 2023) opened at the Shenzhen Convention and Exhibition Centre. This is the world's largest photovoltaic industry event, attracting thousands of companies and professionals from around the world to exhibit and visit. In this exposition, there is a company's booth is particularly eye-catching, it is the world's leading test and measurement instrument manufacturer - Tektronix (Tektronix).
Tektronix's products cover a wide range of fields such as oscilloscopes, logic analysers, spectrum analysers, signal sources, power supplies, multi-meters, sensors, etc., which are widely used in communication, computer, aerospace, automotive, medical, education and other industries. Tektronix has won the trust and praise of customers around the world with its innovative technology, excellent performance and superior quality. At the Optical Expo, Tektronix demonstrated a variety of innovative optoelectronic test solutions covering the latest technology needs in the fields of optical communications, data centres and sensors.
Tektronix demonstrated its real-world test solution for 400G/800G PAM4, a high-speed serial communication technology that can transmit more data with the same bandwidth, and is one of the key technologies to achieve the 400G/800G Ethernet standard. However, PAM4 signals also bring higher testing difficulty, and it is a challenge to effectively measure the quality and performance of PAM4 signals. Tektronix provides a complete set of solutions for this, including a new generation of optical sampling oscilloscopes such as TSO820 and high-performance real-time oscilloscopes such as DPO70000SX. These products can provide up to 70GHz bandwidth and 256GS/s sampling rate, support PAM4 eye diagram, BER, linear regression and many other analysis functions, and can be seamlessly integrated with third-party software for automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers optimise designs, reduce costs and shorten time-to-market.
Grammertech's demonstration of test solutions for 802.3ck optical transmitters. 802.3ck is a new Ethernet standard that supports 100Gbps/200Gbps/400Gbps single-channel rates and uses more complex modulation formats and coding methods. This means more stringent test requirements and specifications for optical transmitters. Tektronix provides a set of solutions for this based on products such as the DPO70000SX real-time oscilloscope and AWG70000 arbitrary waveform generator. This set of solutions can provide up to 70GHz bandwidth and 256GS/s sampling rate, support for a variety of test items under the 802.3ck standard, such as output optical power, eye diagram, eye diagram mask, hopping time, signal integrity, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers meet the requirements of the 802.3ck standard and enhance product competitiveness.
Tektronix's demonstration of the G.Metro test solution. G.Metro is a new optical transmission network architecture based on wavelength division multiplexing (WDM) technology, which enables the transmission of signals of multiple wavelengths on the same optical fibre, thus increasing the utilisation of the optical fibre and the capacity of the network. However, G.Metro also brings higher testing difficulty, and it is a challenge to effectively measure various parameters and performance in G.Metro networks. Tektronix provides a set of solutions for this purpose based on products such as the OM5110 Multi-Wavelength Signal Generator and the DPO70000SX Real-Time Oscilloscope. This set of solutions can provide up to 70GHz bandwidth and 256GS/s sampling rate, support a variety of test items under the G.Metro standard, such as wavelength stability, frequency deviation, phase noise, dispersion, signal-to-noise ratio, etc., and can be seamlessly integrated with third-party software for automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers optimise network design, reduce O&M costs and improve network performance.
Tektronix for 3D sensor testing and optoelectronic device LIV characteristics analysis of the demonstration. 3D sensor is a use of optical principles to measure the shape of the surface of the object and the depth of the information of the device, which has a wide range of applications in smart phones, automotive, medical, security and other fields. An optoelectronic device is a device that converts electrical signals into optical signals or optical signals into electrical signals, and it is one of the core components that make up a 3D sensor. For 3D sensors and optoelectronic devices, a wide range of parameters and performances need to be tested and analysed to ensure their functionality and quality. Tektronix provides a set of solutions for this purpose based on products such as the DPO70000SX real-time oscilloscopes and Keithley 2600B series source testers. This solution can provide up to 70GHz bandwidth and 256GS/s sampling rate, support for 3D sensor testing under a variety of test items, such as laser pulse width, laser pulse peak power, laser pulse repetition frequency, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. The solution can also support a variety of test items under LIV characterisation of optoelectronic devices, such as current-voltage (I-V) curves, current-light power (I-L) curves, current-wavelength (I-λ) curves, etc., and can be seamlessly integrated with third-party software to achieve automated testing and report generation. This solution not only provides high-precision, high-efficiency and high-reliability test results, but also helps customers evaluate product performance.