SUM | Power Test

SUM | Power Test

SUM | Power Test

Source Measurement Unit (SMU)

• Wavelength range: 1260-1620 nm (covering O/E/S/C/L band extended applications)
• Dynamic range: -80 dBm to +26 dBm (automatic range + manual overrange mode)
• Absolute accuracy: ±0.02 dB @ 1550 nm (23°C ±1°C temperature-controlled environment)
• Resolution: 0.001 dB (high-precision mode) / 0.01 dB (standard mode)
• Detector technology: Thermally cooled InGaAs (temperature control accuracy ±0.1°C)

Source Measurement Unit (SMU)

• Wavelength range: 1525–1625 nm, covering the C+L band extended single-mode fiber transmission window
• Power measurement range: -80 dBm to +26 dBm (with automatic attenuator switching function)
• Measurement accuracy: ±0.02 dB (typical value) under constant temperature conditions (25°C ±3°C)
• Resolution: 0.001 dB (high sensitivity mode), 0.01 dB (standard mode)
• Detector configuration: Dual InGaAs detectors (active temperature control ±0.1°C)

Data Acquisition/Module

• Frequency range: 10 MHz to 20 GHz, covering C/Ku/Ka band satellite communication frequencies
• Power output range: -30 dBm to +13 dBm (expandable to +20 dBm with optional accessory)
• Phase noise: <-110 dBc/Hz @10 kHz offset (typical value at 1 GHz carrier)
• Frequency resolution: 0.1 Hz (high-stability temperature-controlled crystal oscillator reference)
• Local oscillator type: Low phase noise YIG oscillator (with active temperature compensation)

Source Measurement Unit (SMU)

• Voltage output range: 0 to 200 V (pulse mode) / ±40 V (DC mode)
• Current output range: ±10 A (pulse peak) / ±1 A (DC continuous)
• Power resolution: 1 μW (equivalent to 0.001 dBm) @ 1550 nm optical device testing
• Four-quadrant operation: Supports bidirectional current sourcing/sinking (optimized for photovoltaic device testing)