Source Measurement Unit (SMU)

• ​With 35 ppm base DCV accuracy, you can measure with confidence.
• ​Small DC current ranges from 100 µA to 10 A allow you to test low-power devices.

DC Power Supply

• Output 1: 0 to 6 V, 0 to 5 A
• Output 2: 0 to +25 V, 0 to 1 A
• Output 3: 0 to -25 V, 0 to 1 A

Source Measurement Unit (SMU)

• 0.0035% Basic DC Voltage Accuracy
• 0.06% Basic AC Voltage Accuracy
• 10mA to 3A Current Range
• 3 Hz to 300 kHz AC bandwidth
• Storage memory up to 512 readings

DC Power Supply

• Voltage: 0.03% + 5 mV
• Current (-3 A to + 5 A): 0.2% + 0.5 mA
• Current (-1 A to + 1 A): 0.1% + 0.2 mA
• Current (-20 mA to + 20 mA): 0.1% + 2.5 µA

Source Measurement Unit (SMU)

• Variable integration time: 10 μs to 10 s (7461A/7461P) 100 μs to 10 s (7451A)
• High-resolution DCI measurements: 1 nA (7461A), 10 nA (7451A)
• Dual-channel DC voltage measurement

DC electronic loads

• Complete protection function
• External synchronous trigger input
• Higher power can work in parallel

Source Measurement Unit (SMU)

• Perform parallel tests for unrivalled throughput
• 20,000 readings/second provides faster test times and the ability to capture device transient performance
• Series offers wide dynamic range: 1fA to 10A and 1µV to 200V
• TSP-Link bus supports channel expansion of up to 32 units/64 channels per GPIB or IP address

SUM | Power Test

• 5 models to choose from, providing up to 5 A current or 100 V
• Low output noise for sensitive devices - ripple and noise less than 350µVrms
• Overvoltage and overcurrent protection for devices
• Stable output with less than 0.01 % load regulation

Source Measurement Unit (SMU)

• 16 ppm basic DCV accuracy allows you to measure with confidence.
• 1 µA range and pA resolution allows testing of low power devices.
• Flexible automated measurements are available via USB or LAN/LXI core interface.
• Now includes digitizing and advanced triggering (DIG) capabilities.