Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Scanning speed: up to 200 nm/s, bidirectional
• Maximum power: > +12 dBm peak typical (options 114, 116, 216) or > +13 dBm peak (option 113)

Tunable Laser System Source

• Wavelength: 1240-1380 nm or 1340-1495 nm or 1450-1650 nm or 1490-1640 nm
• Scanning speed: up to 200 nm/s, bidirectional

Network Analyzer

• Choice of configurations from 9 kHz to 4.5/6.5/9 GHz, 2- or 4-port, 50 Ω load
• Wide dynamic range of 152 dB allows you to accurately measure highly blocked devices under test
• Temperature stability of 0.005 dB/°C minimizes calibration downtime

Network Analyzer

• 10 MHz to 26.5 GHz
• 2-port single source or 4-port with two built-in sources
• 127 dB system and 132 dB receiver dynamic range, 32,001 points, 200 channels, 15 MHz IF bandwidth

Network Analyzer

• Ideal for characterization, modeling and parameter extraction of coaxial or wafer devices
• Apply precise leveling power to the device for power scanning

General electronic instruments

• Reduced system power loss and increased dynamic range
• High power drive signal for increased dynamic range
• Improved low-level scan speed and dynamic range measurements in network analyzers
• Minimum output power: (at +5 dBm input)

General electronic instruments

• 120 dB shortcut amplitude range
• Baseband signal generator with 250 MSa/rate (200 MHz bandwidth) and 512 MSa memory
• Typical update rate of < 500 ns

Generator

• 10 kHz frequency resolution
• 100 µs switching speed (up to 31.6 GHz); 500 µs (up to 40 GHz)
• +10 to -10 dBm amplitude range

Generator

• 10 kHz frequency resolution
• 100 µs switching speed (up to 31.6 GHz); 500 µs (up to 40 GHz)
• +10 to -10 dBm amplitude range