SUM | Power Test

• 5 models to choose from, providing up to 5 A current or 100 V
• Low output noise for sensitive devices - ripple and noise less than 350µVrms
• Overvoltage and overcurrent protection for devices
• Stable output with less than 0.01 % load regulation

BERT

• Parallel BER Tester
• 81200: Configurable for 675 Mb/s to 2.7 Gb/s analysis
• 81250: Configurable for 675 Mb/s to 45 Gb/s analysis
• Modular BER test platform
• Generates and analyzes PRWS, PRBS and user-defined patterns

General electronic instruments

• Fast single-connection measurements of PMD, CD, GD, PDL and IL with improved specifications
• Leading GD repeatability over a wide loss dynamic range
• Outstanding narrow-band device measurement resolution
• Wavelength operating range: 1260 - 1640 nm (O to L band)

Generator

• 20 MHz sine and square waves
• Ramp, triangle, pulse and DC waveforms
• 14-bit, 50 MSa/s, 64 K data point arbitrary waveforms
• AM, FM, PM, ASK, FSK and PSK modulation types

Oscilloscope

• Bandwidth: 70 MHz to 300 MHz
• Sample rate: 2.5 Gsample/s maximum
• Memory depth: 20 Msample maximum

Power Meter

• 1 µs minimum averaging time
• 8 sensor ports
• Scanning and recording application software (no ranging) with up to 65 dB dynamic range
• Power uncertainty ±2.5 %

Power Meter

• Power range: + 10 dBm to - 110 dBm
• Wavelength range: 800 - 1700 nm

Source Measurement Unit (SMU)

• 16 ppm basic DCV accuracy allows you to measure with confidence.
• 1 µA range and pA resolution allows testing of low power devices.
• Flexible automated measurements are available via USB or LAN/LXI core interface.
• Now includes digitizing and advanced triggering (DIG) capabilities.

Attenuation

• Excellent repeatability with insertion loss of 0.03 dB after 5 million repetitions, ensuring accurate measurements and reducing calibration frequency
• Excellent attenuation accuracy and flatness ensure accurate measurements