World-Class Optical Performance
Wavelength range: 350 to 1750nm
High wavelength accuracy: ±0.05nm
High wavelength resolution: 0.05 to 10 nm
Wide dynamic range: 60dB (peak ±1.0nm)
Wide level range: +20 to -80dBm
Fast measurement: 0.5 sec. (100nm span)
Wavelength Resolution Settings:
There are 8 wavelength resolution settings: 0.05 to 10 nm
to enable the user to choose the best value according to the
device/system under test.
Measurable Level Range:
The wide measurable level range is from−80 to +20 dBm. This is suitable to measure high power as well as low power sources used in different fields of application.
Wavelength accuracy:
The ±0.05 nm wavelength accuracy can be maintained by the calibration using the built-in reference light source or an external light source including HeNe laser and Argon light source.
Fast measurement:
The instrument takes only 0.5 s for 100 nm span (with sensitivity set to NORM_AUTO).
Number of sampling: 100001
The number of wavelength samples has been doubled. One sweep can measure a wider wavelength range at high resolution.
Mouse and keyboard operation
More than 30 years of feedback from users have enabled intuitive and easy-to-use front panel operation. Mouse functionality provides ease of use for navigation and the keyboard helps to enter numbers and file names.
Trace zooming
Change display conditions, such as center wavelength and span, by clicking and dragging the mouse.
Enlarge your area of interest instantly and move it at will.
No need for another measurement to modify the display conditions.
Trace calculation and analysis
Seven individual traces
USB ports
Four USB ports in total available on front and back facilitate the use of external devices such as a mouse, keyboard, external hard drives and memory sticks.