The Keysight B1500A Semiconductor Parameter Analyser is an all-in-one device characterisation analyser capable of measuring IV, CV, Pulse/Dynamic I-V parameters. The mainframe and plug-in modules are capable of characterising most electronic devices, materials, semiconductors and active/passive components. The modular architecture of the B1500A semiconductor parameter analyser gives it the flexibility to be upgraded as required.
Quickly switch between CV and IV measurements without reconnecting cables.
Capable of capturing ultra-fast transients that cannot be captured by other conventional test instruments.
Detects multi-frequency AC capacitance measurements in the 1 kHz to 5 MHz range.
Ready to use application libraries
| Device type | Application tests |
| CMOS transistor | Id-Vg, Id-Vd, Vth, breakdown, capacitance, and QSCV |
| Bipolar transistor | Ic-Vc, diode, Gummel plot, breakdown, capacitance, and more |
| Discrete device | Id-Vg, Id-Vd, Ic-Vc, diode, and more |
| Memory | Vth, capacitance, endurance test |
| Power device | Pulsed Id-Vg, pulsed Id-Vd, breakdown |
| Nano device | Resistance, Id-Vg, Id-Vd, Ic-Vc |
| Reliability test | NBTI/PBTI, charge pumping, electromigration, hot carrier injection, J-Ramp, TDDB, and more |
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Powerful capabilities of EasyEXPERT group+
| Measurement capabilities | Staircase sweep, multi-channel sweep, pulse sweep, IV sampling, high-speed IV sampling, CV, C-t, C-f, etc. |
| Switching matrix control | B2200, B2201 and E5250 (E5252 card) are supported. |
| Analysis and data display capabilities | List-display, X-Y graph (with marker, cursor, and line), automatic analysis function, user function, and more |
| Data management | User workspace management, save/recall measurement data and setting with auto-record feature |
