One host can support 1.5 Mbps to 10.7 Gbps all test interfaces
Simultaneous support for full multi-port 10/100/1000 M, Gigabit and 10 Gigabit Ethernet and IP analysis as well as SDH/SONET, OTN analysis
Support for ITU-T G.709 OTN testing including OTU-1 (2.66 Gbps) and OTU-2 (10.71 Gbps) rates
Supports BER insertion with Poisson distribution to correctly evaluate the FEC error correction function of the device
Support contact cascade and arbitrary cascade mapping
Support SDH and SONET framing test and "non-framing" test
Support SDH/SONET overhead setting and monitoring
Support BER test according to ITU-T G.821/G.826/G.828/G.829, M.2100/M.2101/M.2110/M.2120 and GR-820
Support jitter generation and measurement for SONET (OC-1 to OC-192), SDH (STM-0 to STM-64) and OTN (OTU1 and OTU2) in accordance with relevant ITU-T standards
Support SONET (OC-1 to OC-192), SDH (STM-0 to STM-64), OTN (OTU1 and OTU2) all optical signal quality testing
Supports DS1/DS3, E1/2/3/4, STS-1/3/192, STM-0/1/64 and OTU2 all electrical signal quality testing
Pass-through mode support for all SDH/SONET, PDH/DSn and OTN rates
Provides 1/16 clock sync or frame sync output signals that can be used to trigger external sampling oscilloscopes
The Network Performance Analyzer MP1590B not only supports traditional SDH/SONET, PDH/DSn and OTN device and jitter testing, but can also be configured to support IP network testing up to 10G with the Ethernet pluggable module in the MD1230B test system. By configuring different pluggable modules, the MP1590B can simultaneously support various test applications such as SDH/SONET, OTN, jitter and Ethernet testing.
The MP1590B-30 high precision jitter analysis option takes jitter measurements to a higher level of accuracy and provides the industry's only traceable new calibration standard.
The Anritsu Network Performance Analyzer MP1590B not only supports traditional SDH/SONET, PDH/DSn and OTN devices and jitter testing, but can also be configured to support IP network testing up to 10G with the Ethernet pluggable module in the MD1230B test system