Features
Parallel BER Tester
81200: Configurable for 675 Mb/s to 2.7 Gb/s analysis
81250: Configurable for analysis from 675 Mb/s to 45 Gb/s
Modular BER test platform
Generate and analyze PRWS, PRBS, and user-defined patterns
If you are an R&D or manufacturing engineer performing functional and parametric testing on digital subsystems, ICs or circuit boards, the Agilent 81200 data generator/analyzer platform is the right choice for you. 81200 allows full verification and characterization of digital devices throughout the development cycle, reducing risk, cost and time to market.
The 81200 is a modular system offering excitation and analyzer channels in speed classes 200/330/675/2.700Mb/s.
The Agilent ParBERT 81250 is a modular parallel electrical and optical bit-error-rate (BER) test platform operating at rates up to 45 Gb/s. The ParBERT 81250 platform includes modules operating at 675 Mb/s, 1.65 Gb/s, 2.7 Gb/s, 3.35 Gb/s, 7 Gb/s, 10.8 Gb/s, 13.5 Gb/s, and 45 Gb/s. The system generates pseudo-random word sequences (PRWS), standard pseudo-random binary sequences (PRBS), and user-defined patterns on parallel lines. You can use user-defined patterns, PRBS/PRWS or mixed data (combination of user-defined patterns and PRBS) to analyze the BER.
The ParBERT 81250 is well suited for parallel-to-serial, serial-to-parallel, serial-to-serial, and multiple serial BER testing. For example, multiplexers and demultiplexers (Mux/Demux) - or SerDes (Serializer/Demux) - are used for testing of telecom and storage area network (SAN) ICs, multiple transmitter and receiver testing in manufacturing, amplifiers, and 10GbE and forward error correction (FEC) device testing.
It is also an ideal extension of the IC tester's high-speed channel.
If required, the ParBERT 81250 also provides data and control signals for the DUT.
