The R&S®RTE1000 oscilloscope provides a fully integrated multi-domain test solution with time domain, frequency domain, protocol and logic analysis capabilities. For embedded design development, power electronics analysis and general debugging, the R&S®RTE1000 handles everyday test and measurement challenges quickly, accurately and easily.
Up to 16-bit vertical resolution
200 Msample memory depth for analysis of long sequences
Waveform capture rate of up to 1 million waveforms/second for fast signal fault finding
Optimized touch operation
More reliable measurement results
Very low intrinsic noise for accurate measurements
Single-core analog-to-digital converter and up to 16-bit vertical resolution
Full measurement bandwidth support, even at 500 µV/div
High temporal resolution and deep storage
Quickly find rare signal faults with a capture rate of one million waveforms per second
Digital trigger system for precise triggering
More features and faster access to results
Automated measurements: 77 measurement functions
Fast measurement: One click to get key measurement results
History function: Playback
Template testing: set up in seconds
FFT function: easily analyze the signal spectrum
Search and navigation: attention to detail
Designed to meet multi-domain measurement challenges
Logic analysis: Test embedded designs quickly and accurately
Serial protocols: easy triggering and decoding
Power analysis
Spectrum analysis
EMI Debugging: Testing during development
Integrated Arbitrary Waveform Generator
