Delivering Signal High Fidelity for More Challenging System Designs
Current high-speed circuits make signal path verification and BER analysis even more challenging. With higher TDR bandwidth, faster S-parameter measurement capabilities and full support for optical standards testing, the DSA8200 Digital Serial Analyzer provides a complete high-speed physical layer test platform.
DSA8200Overview of sampling oscilloscopes
Function | Advantages |
| Up to 4 true differential channels | Accurately detect non-linear devices such as amplifiers using real differential TDR excitation signals. |
| High bandwidth (50 GHz) time domain reflectometer | The impedance discontinuity is broken down to 1 mm with an incidence level of 12 ps. |
| Optical module with low noise, high optical sensitivity, extinction ratio calibration function and wide wavelength | Meet all major standards from 8.5Gb/s - 40Gb/s with one optical test solution. |
| IConnect® Signal Integrity | Reduce measurement errors caused by signal degradation of test fixtures with integrated TDR and S-parameter measurements. |
| Serial Data Network Analysis (SDNA) | Reduce test costs with one instrument for time and frequency domain analysis Accurately analyze signal paths to predict signal crosstalk and jitter, ensuring reliable system operation |
| Serial Data Link Analysis (SDLA) | Determine the exact cause of eye closure with jitter, noise and BER analysis Maximize the receiver's eye-open time by quickly evaluating various FE/DFE equalization settings |
| Remote sampling head | Optimize signal fidelity and minimize the impact of probes, cables and test fixtures by placing the TDR head close to the device under test. |
