The DSA8300 is an advanced equivalent-time sampling oscilloscope that provides industry-leading fidelity measurement and analysis capabilities for communications signal analysis, serial data network analysis, and serial data link analysis applications.
Key performance indicators
Low time base jitter:
<100 fs on up to 6 channels in the 82A04B phase reference module
Vertical resolution - 16-bit analog-to-digital converter
Electrical interface resolution: <20 µV LSB (for 1 v full scale)
Optical interface resolution from <20 nW for the 80C07B (1 mW full scale) to <0.6 µW for the 80C10C (30 mW full scale)
Optical interface bandwidth >80 GHz
Electrical interface bandwidth >70 GHz
Over 120 automatic measurements for NRZ, RZ and pulse signal types
More than 80 industry-standard templates for automatic template testing
Complex jitter/noise/BER/SER analysis (80SJNB) to support complex measurements TDECQ 1, SNDR 2 (applications)
1PAM4 transmitter and dispersion eye diagram closure quadrant.
2S signal-to-noise distortion ratio.
Main features
A variety of optical interface modules, electrical interface modules and accessory modules are available to meet your specific test requirements.
Optical Interface Modules
Optical modules supporting optical data rates from 155 Mb/s to 10 Gb/s, 40 Gb/s, 100 Gb/s and 50G/100G/200G/400G PAM4
Optical Reference Receiver (ORR) 1 meets the requirements specified in the standards-based conformance test
Optical interface sampling module provides high optical sensitivity, low noise and wide dynamic range to accurately test and calibrate short-range to remote optical interface communication standards
Fully calibrated clock recovery solution - no need to manually calibrate for data pickup loss
Calibrated extinction ratio measurements and variable correction ER measurements ensure accuracy and repeatability
Electrical Interface Module
Ultra-low noise electrical sampler (280 μV at 20 GHz, 450 μV at 60 GHz, typical)
Selectable bandwidth2 allows users to balance bandwidth and noise for excellent data acquisition performance
Remote sampler or compact sample expander module cable minimizes signal degradation because the sampler can be placed near the device under test
High-performance integrated TDR (10 ps typical step-up time) supports outstanding impedance discontinuity detection and provides high dynamic range for S-parameter measurements with bandwidths up to 50 GHz
Analysis
Performs jitter, noise, and BER analysis on high-speed PAM4 and PAM2 NRZ serial data at rates between <1 GBd and 60 GBd to understand the exact cause of eye diagram closure
Analyzes PAM4 signals with full analysis of jitter, noise, and BER for each PAM eye diagram and supports a set of global measurements to evaluate the overall PAM4 signal properties
100G-SR4/Transmitter and Dispersive Eye Diagram Closure (TDEC) automation provides complete testing and debugging of TX optical properties critical to SR4 short-haul Ethernet
80STDEC simplifies high-performance transmitter and dispersion eye diagram closure (TDEC) measurements, making it ideal for production and conformance verification applications
Automated template testing with support for over 80 industry standard templates. New templates can be imported into the DSA8300 to support a variety of emerging standards. Users can define their own templates to automate template testing
Jitter, noise, BER, template testing and serial data link analysis (SDLA) available through 80SJNB Essentials and Advanced application software options
Advanced TDR analysis, S-parameter measurements, simulation model extraction and serial link simulation capabilities available through IConnect® application software options
400G-M4 optical manufacturing analysis software provides optical transmitter and dispersion eye diagram closure quadrant (TDECQ) analysis
High test throughput
High sampling rates of up to 200 kS/s per channel
Efficient programming interface (IEEE-488, Ethernet or local processor access) for high test throughput
1 The Optical Reference Receiver (ORR) is a fourth-order Bessel-Thompson filter with standard-specified frequency response and tolerance. Tektronix optimizes the response to achieve nominal fit and high-quality template test results.
2Refer to the 80E00 Electrical Sampling Module Product Technical Information for a detailed description of each module.
Applications
Design/verify telecom and datacom devices and systems
ITU/ANSI/IEEE/SONET/SDH manufacturing/conformance testing
High performance true differential TDR measurements
Impedance verification and network analysis for serial data applications, including S-parameters
Advanced jitter, noise, BER and SDLA analysis
Channel-based and eye-diagram simulation and measurement modeling using IConnect
