MS9740B Anritsu Spectrum Analyzer
Main features
Passive device measurement speed of less than 0.2 seconds (5 nm) and short resolution time.
Dedicated application software for evaluating optical active devices
Excellent cost performance
Low power consumption (75VA) and light weight (under 15kg)
Minimum resolution bandwidth of 30 percent
One unit for single-mode fiber and multimode fiber
Description
The MS9740B spectral analyzer achieves an overall test speed of less than 0.2 seconds from waveform scanning to waveform resolution and data transfer to external control devices.The MS9740B has enhanced the VBW settings (1 kHz and 200 Hz) commonly used by users, not only maintaining the same measurement sensitivity as previous models, but also reducing the measurement time by 50%, helping to further improve user productivity. Reducing production costs for optical active device manufacturers, including optical transceiver modules, is an important issue. The test instruments required for device testing are expected to enable efficient evaluation testing and thus reduce testing time.
Application areas
Spectral characteristics testing of active and passive optical devices
Emission spectrum testing of optical transceiver modules
TO-CAN device testing
WDM signal testing
EDFA performance analysis testing
Modulated and pulsed light testing
Main performance and specifications
Main features
Passive device measurement speed of less than 0.2 seconds (5 nm) and short resolution time.
Dedicated application software for evaluating optical active devices
Excellent cost performance
Low power consumption (75VA) and light weight (under 15kg)
Minimum resolution bandwidth of 30 percent
One unit for single-mode fiber and multimode fiber
Description
The MS9740B spectral analyzer achieves an overall test speed of less than 0.2 seconds from waveform scanning to waveform resolution and data transfer to external control devices.The MS9740B has enhanced the VBW settings (1 kHz and 200 Hz) commonly used by users, not only maintaining the same measurement sensitivity as previous models, but also reducing the measurement time by 50%, helping to further improve user productivity. Reducing production costs for optical active device manufacturers, including optical transceiver modules, is an important issue. The test instruments required for device testing are expected to enable efficient evaluation testing and thus reduce testing time.
Application areas
Spectral characteristics testing of active and passive optical devices
Emission spectrum testing of optical transceiver modules
TO-CAN device testing
WDM signal testing
EDFA performance analysis testing
Modulated and pulsed light testing
Main performance and specifications